| Publication CODE |
Title |
| IEC 60749-37:2008 (2008-01) |
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 37: BOARD LEVEL DROP TEST METHOD USING AN ACCELEROMETER |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
122.00 €
|
39. |
Description
Provides a test method that is intended to evaluate and compare drop performance of surface mount electronic components for handheld electronic product applications in an accelerated test environment, where excessive flexure of a circuit board causes product failure. The purpose is to standardize the test board and test methodology to provide a reproducible assessment of the drop test performance of surface-mounted components while producing the same failure modes normally observed during product level test.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2008-01-30 |
| ICS-Code (International Standards Classification) |
31.080.01
|
|
| IEC publication date |
2008-01-30 |
| IEC stability date |
2021-12-31 |
| IEC last modification date |
2017-02-03 |
|
