| Publication CODE |
Title |
| NBN EN 60749-30:2005 (2005-03) |
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS
PART 30: PRECONDITIONING OF NON-HERMETIC SURFACE MOUNT DEVICES PRIOR TO RELIABILITY TESTING |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
25.00 €
|
3 P. |
Description
Establishes a standard procedure for determining the preconditioning of non-hermetic surface mount devices (SMDs) prior to reliability testing. The test method defines the preconditioning flow for non-hermetic solid-state SMDs representative of a typical industry multiple solder reflow operation.
|
| Class |
C86
(ELECTRONIC COMPONENTS MICRO ELECTRONICS - DISCRETE SEMICONDUCTORS)
|
Available files
ATTENTION: Belgian registered standards (NBN EN or NBN HD) are generally
only available in English or French. Only the cover page is translated
and the document itself is in English or in French.
Very important notice: 98% of the text of the NBN EN 55XXX,
NBN EN 6XXXX comes from the IEC text which is NOT included.
This text can be ordered here:
IEC 60749-30:2005.
For the series NBN EN 50XXX, the standards are however complete.
|
EN version
|
FR version
|
NL version
|
DE version
|
|
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2005-02-01 |
| NBN Approval |
2005-09-30 |
| Registration |
65043 |
| ICS-Code (International Standards Classification) |
31.080.01
|
| NBN Status |
Adapted |
|
| Date of ratification (d.o.r.) |
2005-02-01 |
| Date of availability (d.a.v.) |
2005-03-01 |
| Date of announcement (d.o.a.) |
2005-05-01 |
| Date of publication (d.o.p.) |
2005-11-01 |
| Date of withdrawal former edition (d.o.w.) |
2008-02-01 |
|
