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Publication details

Publication CODE Title
NBN EN 62374:2008 (2007-10) SEMICONDUCTOR DEVICES - TIME DEPENDENT DIELECTRIC BREAKDOWN (TDDB) TEST FOR GATE DIELECTRIC FILMS
 
Price Excl. VAT Total number of pages, tables and drawings
25.00 € 2 P.
Description
[Text at this stage is not available in English]
Class  C86  (ELECTRONIC COMPONENTS MICRO ELECTRONICS - DISCRETE SEMICONDUCTORS)
Available files
ATTENTION: Belgian registered standards (NBN EN or NBN HD) are generally only available in English or French. Only the cover page is translated and the document itself is in English or in French.

Very important notice: 98% of the text of the NBN EN 55XXX, NBN EN 6XXXX comes from the IEC text which is NOT included. This text can be ordered here: IEC 62374:2007. For the series NBN EN 50XXX, the standards are however complete.

EN version
FR version
DE version
Status
Status Registered trilingual Belgian standard EN or FR or DE
Situation Currently active
Origin
Committee TC 47
SEMICONDUCTOR DEVICES
Responsible Ir DELENS Marc
Approval
BEC Approval 2007-10-01
NBN Approval 2008-01-29
Registration 85157
ICS-Code (International Standards Classification) 31.080
NBN Status New
Date of ratification (d.o.r.) 2007-10-01
Date of availability (d.a.v.) 2007-10-19
Date of announcement (d.o.a.) 2008-01-01
Date of publication (d.o.p.) 2008-07-01
Date of withdrawal former edition (d.o.w.) 2010-10-01
Correspondences with international standards
Relation International standard Date
is identical to EN 62374:2007 2007-10-19
is identical to IEC 62374:2007/ed. 1.0 2007-03-01