| Publication CODE |
Title |
| IEC 62899-503-3:2021 (2021-08) |
PRINTED ELECTRONICS - PART 503-3: QUALITY ASSESSMENT - MEASURING METHOD OF CONTACT RESISTANCE FOR THE PRINTED THIN FILM TRANSISTOR - TRANSFER LENGTH METHOD |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
85.00 €
|
13. |
Description
IEC 62899-503-3:2021(E) specifies a measuring method of contact resistance for printed thin film transistors (TFTs) by the transfer length method (TLM). The method requires the fabrication of a test element group (TEG) with varying channel length (L) between source and drain electrodes. The method is intended for quality assessment of TFT electrode contacts and is suited for determining whether the contact resistance lies within a desired range.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Status |
IEC PUBLICATION |
| Situation |
Currently active
|
|
| Committee |
TC 119
PRINTED ELECTRONICS
|
| Responsible |
Monsieur DE LEEUW Thierry, Technical Officer
Diamant Building
Bd Auguste Reyers, 80
1030
BRUXELLES
Phone: +32 2 706 85 72
E-mail: thierry.deleeuw@ceb-bec.be
|
| BEC Approval |
2021-08-24 |
| ICS-Code (International Standards Classification) |
29.045
, 31.080.30
|
| NBN Status |
New |
|
| IEC publication date |
2021-08-24 |
| IEC stability date |
2026-12-31 |
| IEC file modification date |
2021-08-24 |
| IEC last modification date |
2021-08-24 |
|
