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Publication details

Publication CODE Title
IEC 62951-6:2019 (2019-05) SEMICONDUCTOR DEVICES - FLEXIBLE AND STRETCHABLE SEMICONDUCTOR DEVICES - PART 6: TEST METHOD FOR SHEET RESISTANCE OF FLEXIBLE CONDUCTING FILMS
 
Price Excl. VAT Total number of pages, tables and drawings
159.00 € 50.
Description
IEC 62951-6:2019 specifies terms, as well as the test method and report of sheet resistance of the flexible conducting film under bending and folding tests. The measurement methods include the 2-point probe, 4-point probe and Montgomery method, which can be applied to in-situ and ex-situ measurement and the measurements of anisotropic sheet resistance.
Class  C990  (IEC PUBLICATIONS IEC PUBLICATIONS)
Available files
EN/FR version

Status
Status IEC PUBLICATION
Situation Currently active
Origin
Committee TC 47
SEMICONDUCTOR DEVICES
Responsible Ir DELENS Marc
Approval
BEC Approval 2019-05-06
ICS-Code (International Standards Classification) 31.080.99
NBN Status New
IEC publication date 2019-05-06
IEC stability date 2023-12-31
IEC file modification date 2019-05-06
IEC last modification date 2019-05-22