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Publication details

Publication CODE Title
IEC 62374-1:2010 (2010-09) SEMICONDUCTOR DEVICES - PART 1: TIME-DEPENDENT DIELECTRIC BREAKDOWN (TDDB) TEST FOR INTER-METAL LAYERS
 
Price Excl. VAT Total number of pages, tables and drawings
85.00 € 32 P.
Description
IEC 62374-1:2010 describes a test method, test structure and lifetime estimation method of the time-dependent dielectric breakdown (TDDB) test for inter-metal layers applied in semiconductor devices.
Class  C990  (IEC PUBLICATIONS IEC PUBLICATIONS)
Available files
EN/FR version

Status
Status IEC PUBLICATION
Situation Currently active
Origin
Committee TC 47
SEMICONDUCTOR DEVICES
Responsible Ir DELENS Marc
Approval
BEC Approval 2010-09-29
Registration 0
ICS-Code (International Standards Classification) 31.080.99
IEC publication date 2010-09-29
IEC stability date 2025-12-31
IEC last modification date 2018-11-22