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Publication details

Publication CODE Title
IEC 60749-16:2003 (2003-01) SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 16: PARTICLE IMPACT NOISE DETECTION (PIND)
 
Price Excl. VAT Total number of pages, tables and drawings
21.00 € 13.
Description
Defines a test aiming at detecting the presence of loose particles inside a cavity device such as, for example, chips of ceramic, pieces of bonding wire or solder balls (prills).
Class  C990  (IEC PUBLICATIONS IEC PUBLICATIONS)
Available files
EN/FR version

Status
Status IEC PUBLICATION
Situation Currently active
Replaces  IEC PAS 62171:2000
Origin
Committee TC 47
SEMICONDUCTOR DEVICES
Responsible Ir DELENS Marc
Approval
BEC Approval 2003-01-17
ICS-Code (International Standards Classification) 31.080.01
IEC publication date 2003-01-17
IEC stability date 2031-12-31
IEC last modification date 2019-11-20