Publication CODE |
Title |
NBN EN 62047-11:2013 (2013-09) |
SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES
PART 11: TEST METHOD FOR COEFFICIENTS OF LINEAR THERMAL EXPANSION OF FREE-STANDING MATERIALS FOR MICRO-ELECTROMECHANICAL SYSTEMS |
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Price Excl. VAT |
Total number of pages, tables and drawings |
25.00 €
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3 P. |
Description
Specifies the test method to measure the linear thermal expansion coefficients (CLTE) of thin free-standing solid (metallic, ceramic, polymeric, etc.) micro-electro-mechanical system (MEMS) materials with length between 0,1 mm and 1 mm and width between 10 micrometre and 1 mm and thickness between 0,1 micrometre and 1 mm, which are main structural materials used for MEMS, micromachines and others. This test method is applicable for the CLTE measurement in the temperature range from room temperature to 30 % of a material's melting temperature.
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Class |
C96
(TELECOMMUNICATIONS - ELECTRONIC MICRO ELECTRONICS - DISCRETE SEMICONDUCTOR DEVICES)
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Available files
ATTENTION: Belgian registered standards (NBN EN or NBN HD) are generally
only available in English or French. Only the cover page is translated
and the document itself is in English or in French.
Very important notice: 98% of the text of the NBN EN 55XXX,
NBN EN 6XXXX comes from the IEC text which is NOT included.
This text can be ordered here:
IEC 62047-11:2013.
For the series NBN EN 50XXX, the standards are however complete.
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EN version
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FR version
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DE version
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Status |
Registered trilingual Belgian standard EN or FR or DE |
Situation |
Currently active
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Committee |
TC 47/SC 47F
MICRO-ELECTROMECHANICAL SYSTEMS
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Responsible |
Ir DELENS Marc
|
BEC Approval |
2013-08-21 |
NBN Approval |
2013-12-19 |
Belgian Official Journal |
2014-03-14 |
Registration |
145086 |
ICS-Code (International Standards Classification) |
31.080.99
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NBN Status |
New |
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Date of ratification (d.o.r.) |
2013-08-21 |
Date of availability (d.a.v.) |
2013-09-27 |
Date of announcement (d.o.a.) |
2013-11-21 |
Date of publication (d.o.p.) |
2014-05-21 |
Date of withdrawal former edition (d.o.w.) |
2016-08-21 |
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