Publication CODE |
Title |
NBN EN 60749-23:2005 (2004-04) |
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS
PART 23: HIGH TEMPERATURE OPERATING LIFE |
|
Price Excl. VAT |
Total number of pages, tables and drawings |
25.00 €
|
3 P.. |
Description
This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating condition in an accelerated way, and is primarily used for device qualification and reliability monitoring.
|
Class |
C86
(ELECTRONIC COMPONENTS MICRO ELECTRONICS - DISCRETE SEMICONDUCTORS)
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Available files
ATTENTION: Belgian registered standards (NBN EN or NBN HD) are generally
only available in English or French. Only the cover page is translated
and the document itself is in English or in French.
Very important notice: 98% of the text of the NBN EN 55XXX,
NBN EN 6XXXX comes from the IEC text which is NOT included.
This text can be ordered here:
IEC 60749-23:2004.
For the series NBN EN 50XXX, the standards are however complete.
|
EN version
|
FR version
|
NL version
|
DE version
|
|
Status |
Registered trilingual Belgian standard EN or FR or DE |
Situation |
Currently active
|
|
Committee |
TC 47
SEMICONDUCTOR DEVICES
|
Responsible |
Ir DELENS Marc
|
BEC Approval |
2004-04-01 |
NBN Approval |
2005-01-26 |
Registration |
55269 |
ICS-Code (International Standards Classification) |
31.080.01
|
NBN Status |
Adapted |
|
Date of ratification (d.o.r.) |
2004-04-01 |
Date of availability (d.a.v.) |
2004-04-01 |
Date of announcement (d.o.a.) |
2004-07-01 |
Date of publication (d.o.p.) |
2005-01-01 |
Date of withdrawal former edition (d.o.w.) |
2007-04-01 |
|