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Publication details

Publication CODE Title
IEC 60749-35:2006 (2006-07) SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 35: ACOUSTIC MICROSCOPY FOR PLASTIC ENCAPSULATED ELECTRONIC COMPONENTS
 
Price Excl. VAT Total number of pages, tables and drawings
159.00 € 43.
Description
Defines the procedures for performing acoustic microscopy on plastic encapsulated electronic components. Provides a guide to the use of acoustic microscopy for detecting anomalies (delamination, cracks, mould-compound voids, etc.) reproducibly and non-destructively in plastic packages.
Class  C990  (IEC PUBLICATIONS IEC PUBLICATIONS)
Available files
EN/FR version

Status
Status IEC PUBLICATION
Situation Currently active
Origin
Committee TC 47
SEMICONDUCTOR DEVICES
Responsible Ir DELENS Marc
Approval
BEC Approval 2006-07-18
ICS-Code (International Standards Classification) 31.080.01
IEC publication date 2006-07-18
IEC stability date 2024-12-31
IEC last modification date 2019-11-20