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Publication details

Publication CODE Title
IEC 63284:2022 (2022-04) SEMICONDUCTOR DEVICES - RELIABILITY TEST METHOD BY INDUCTIVE LOAD SWITCHING FOR GALLIUM NITRIDE TRANSISTORS
 
Price Excl. VAT Total number of pages, tables and drawings
85.00 € 25.
Description
IEC 63284:2022 covers the protocol of performing a stress procedure and a corresponding test method to evaluate the reliability of gallium nitride (GaN) power transistors by inductive load switching, specifically hard-switching stress
Class  C990  (IEC PUBLICATIONS IEC PUBLICATIONS)
Available files
EN/FR version

Status
Status IEC PUBLICATION
Situation Currently active
Origin
Committee TC 47
SEMICONDUCTOR DEVICES
Responsible Ir DELENS Marc
Approval
BEC Approval 2022-04-21
ICS-Code (International Standards Classification) 31.080.30
NBN Status New
IEC publication date 2022-04-21
IEC stability date 2026-12-31
IEC file modification date 2022-04-21
IEC last modification date 2022-04-21