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Publication details

Publication CODE Title
IEC 60749-37:2008 (2008-01) SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 37: BOARD LEVEL DROP TEST METHOD USING AN ACCELEROMETER
 
Price Excl. VAT Total number of pages, tables and drawings
122.00 € 39.
Description
Provides a test method that is intended to evaluate and compare drop performance of surface mount electronic components for handheld electronic product applications in an accelerated test environment, where excessive flexure of a circuit board causes product failure. The purpose is to standardize the test board and test methodology to provide a reproducible assessment of the drop test performance of surface-mounted components while producing the same failure modes normally observed during product level test.
Class  C990  (IEC PUBLICATIONS IEC PUBLICATIONS)
Available files
EN/FR version

Status
Status IEC PUBLICATION
Situation Withdrawn
Replaced by  IEC 60749-37:2022
Replaces  IEC PAS 62050:2004
Origin
Committee TC 47
SEMICONDUCTOR DEVICES
Responsible Ir DELENS Marc
Approval
BEC Approval 2008-01-30
ICS-Code (International Standards Classification) 31.080.01
IEC publication date 2008-01-30
IEC stability date 2021-12-31
IEC last modification date 2017-02-03