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Publication details

Publication CODE Title
IEC PAS 62483:2006 (2006-09) TEST METHOD FOR MEASURING WHISKER GROWTH ON TIN AND TIN ALLOY SURFACE FINISHES
 
Price Excl. VAT Total number of pages, tables and drawings
201.00 € 27.
Description
Provides the methodology applicable for studying tin whisker growth from finishes containing a predominance of tin (Sn). This test method may not be sufficient for applications with special requirements, e.g., military or aerospace. Additional requirements may be specified in the appropriate requirements document
Class  C990  (IEC PUBLICATIONS IEC PUBLICATIONS)
Available files
EN version

Status
Status IEC PUBLICATION
Situation Withdrawn
Replaced by  IEC 62483:2013
Origin
Committee TC 47
SEMICONDUCTOR DEVICES
Responsible Ir DELENS Marc
Approval
BEC Approval 2006-09-12
ICS-Code (International Standards Classification) 35.040
IEC publication date 2006-09-12
IEC stability date 2012-12-31
IEC last modification date 2013-09-25