Publication CODE |
Title |
IEC PAS 62483:2006 (2006-09) |
TEST METHOD FOR MEASURING WHISKER GROWTH ON TIN AND TIN ALLOY SURFACE FINISHES |
|
Price Excl. VAT |
Total number of pages, tables and drawings |
201.00 €
|
27. |
Description
Provides the methodology applicable for studying tin whisker growth from finishes containing a predominance of tin (Sn). This test method may not be sufficient for applications with special requirements, e.g., military or aerospace. Additional requirements may be specified in the appropriate requirements document
|
Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
Committee |
TC 47
SEMICONDUCTOR DEVICES
|
Responsible |
Ir DELENS Marc
|
BEC Approval |
2006-09-12 |
ICS-Code (International Standards Classification) |
35.040
|
|
IEC publication date |
2006-09-12 |
IEC stability date |
2012-12-31 |
IEC last modification date |
2013-09-25 |
|