| Publication CODE |
Title |
| IEC 60749-43:2017 (2017-06) |
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 43: GUIDELINES FOR IC RELIABILITY QUALIFICATION PLANS |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
249.00 €
|
74. |
Description
IEC 60749-43:2017 gives guidelines for reliability qualification plans of semiconductor integrated circuit products (ICs). This document is not intended for military- and space-related applications.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2017-06-15 |
| ICS-Code (International Standards Classification) |
31.080.01
|
| NBN Status |
New |
|
| IEC publication date |
2017-06-15 |
| IEC stability date |
2021-12-31 |
| IEC file modification date |
2017-06-15 |
| IEC last modification date |
2018-01-11 |
|
