| Publication CODE |
Title |
| IEC 63287-1:2021 (2021-08) |
SEMICONDUCTOR DEVICES - GENERIC SEMICONDUCTOR QUALIFICATION GUIDELINES - PART 1: GUIDELINES FOR IC RELIABILITY QUALIFICATION |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
286.00 €
|
86. |
Description
IEC 63287-1:2021 gives guidelines for reliability qualification plans of semiconductor integrated circuit products. This document is not intended for military- and space-related applications.
NOTE 1'The manufacturer can use flexible sample sizes to reduce cost and maintain reasonable reliability by this guideline adaptation based on EDR-4708, AEC Q100, JESD47 or other relevant document can also be applicable if it is specified.
NOTE 2'The Weibull distribution method used in this document is one of several methods to calculate the appropriate sample size and test conditions of a given reliability project.
This first edition of IEC 63287-1 cancels and replaces the first edition of IEC 60749-43 published in 2017. This edition constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous edition:
- the document has been renamed and renumbered to distinguish it from the IEC 60749 (all parts);
- a new section concerning the concept of "family" has been added with appropriate renumbering of the existing text.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2021-08-25 |
| ICS-Code (International Standards Classification) |
31.080.01
|
| NBN Status |
New |
|
| IEC publication date |
2021-08-25 |
| IEC stability date |
2025-12-31 |
| IEC file modification date |
2021-08-25 |
| IEC last modification date |
2021-08-25 |
|
