| Publication CODE |
Title |
| IEC 60749-36:2003 (2003-02) |
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 36: ACCELERATION, STEADY STATE |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
11.00 €
|
7. |
Description
Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2003-02-13 |
| ICS-Code (International Standards Classification) |
31.080.01
|
|
| IEC publication date |
2003-02-13 |
| IEC stability date |
2024-12-31 |
| IEC last modification date |
2019-11-20 |
|
