| Publication CODE |
Title |
| IEC 60147-2:1963 (1963-01) |
ESSENTIAL RATINGS AND CHARACTERISTICS OF SEMICONDUCTOR DEVICES AND GENERAL PRINCIPLES OF MEASURING METHODS - PART 2: GENERAL PRINCIPLES OF MEASURING METHODS |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
201.00 €
|
55 P. |
Description
Gives information based on current practice on measurements of certain device parameters and deals primarily with the parameters listed in IEC 147-1. It is intended that it will be eventually extended to cover all these parameters. This publication deals with transistors only.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Status |
IEC PUBLICATION |
| Situation |
Withdrawn
|
|
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
1963-01-01 |
| ICS-Code (International Standards Classification) |
35.040
|
| NBN Status |
New |
|
| IEC publication date |
1963-01-01 |
| IEC last modification date |
2013-07-03 |
|
