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Publication details

Publication CODE Title
IEC 60749:1996/AMD1:2000 (2000-07) AMENDMENT 1 - SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS
 
Price Excl. VAT Total number of pages, tables and drawings
42.00 € 21.
Description
[Text at this stage is not available in English]
Class  C990  (IEC PUBLICATIONS IEC PUBLICATIONS)
Available files
EN/FR version
Status
Status IEC PUBLICATION
Situation Withdrawn
Partly replaced by  IEC 60749-25:2003
Partly replaced by  IEC 60749-7:2002
Partly replaced by  IEC 60749-6:2002
Partly replaced by  IEC 60749-5:2003
Partly replaced by  IEC 60749-4:2002
Partly replaced by  IEC 60749-3:2002
Partly replaced by  IEC 60749-21:2004
Partly replaced by  IEC 60749-20:2002
Partly replaced by  IEC 60749-15:2003
Partly replaced by  IEC 60749-8:2002
Partly replaced by  IEC 60749-36:2003
Partly replaced by  IEC 60749-9:2002
Partly replaced by  IEC 60749-31:2002
Partly replaced by  IEC 60749-1:2002
Partly replaced by  IEC 60749-24:2004
Partly replaced by  IEC 60749-22:2002
Partly replaced by  IEC 60749-2:2002
Partly replaced by  IEC 60749-19:2003
Partly replaced by  IEC 60749-14:2003
Partly replaced by  IEC 60749-13:2002
Partly replaced by  IEC 60749-12:2002
Partly replaced by  IEC 60749-11:2002
Partly replaced by  IEC 60749-10:2002
Partly replaced by  IEC 60749-32:2002
Replaced by  IEC 60749-36:2003
Replaced by  IEC 60749-32:2002
Replaced by  IEC 60749-31:2002
Replaced by  IEC 60749-25:2003
Replaced by  IEC 60749-24:2004
Replaced by  IEC 60749-22:2002
Replaced by  IEC 60749-21:2004
Replaced by  IEC 60749-20:2002
Replaced by  IEC 60749-19:2003
Replaced by  IEC 60749-15:2003
Replaced by  IEC 60749-14:2003
Replaced by  IEC 60749-13:2002
Replaced by  IEC 60749-12:2002
Replaced by  IEC 60749-11:2002
Replaced by  IEC 60749-10:2002
Replaced by  IEC 60749-9:2002
Replaced by  IEC 60749-8:2002
Replaced by  IEC 60749-7:2002
Replaced by  IEC 60749-6:2002
Replaced by  IEC 60749-5:2003
Replaced by  IEC 60749-4:2002
Replaced by  IEC 60749-3:2002
Replaced by  IEC 60749-2:2002
Replaced by  IEC 60749-1:2002
Origin
Committee TC 47
SEMICONDUCTOR DEVICES
Responsible Ir DELENS Marc
Approval
BEC Approval 2000-07-31
ICS-Code (International Standards Classification) 31.080.01
NBN Status New
IEC publication date 2000-07-31
IEC last modification date 2017-08-23