| Publication CODE |
Title |
| IEC PAS 62203:2000 (2000-11) |
GUIDE FOR THE STANDARD PROBE PAD SIZES AND LAYOUTS FOR WAFER-LEVEL ELECTRICAL TESTING |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
21.00 €
|
6. |
Description
Applies to double- and single-column arrays of metal probe pads, on a semiconductor wafer or chip, that are electrically connected to one or more test structures.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Status |
IEC PUBLICATION |
| Situation |
Withdrawn
|
|
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2000-11-28 |
| ICS-Code (International Standards Classification) |
35.040
|
| NBN Status |
New |
|
| IEC publication date |
2000-11-28 |
| IEC last modification date |
2004-05-17 |
|
