| Publication CODE |
Title |
| IEC TS 62916:2017 (2017-04) |
PHOTOVOLTAIC MODULES - BYPASS DIODE ELECTROSTATIC DISCHARGE SUSCEPTIBILITY TESTING |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
85.00 €
|
13. |
Description
IEC TS 62916:2017(E) describes a discrete component bypass diode electrostatic discharge (ESD) immunity test and data analysis method. The test method described subjects a bypass diode to a progressive ESD stress test and the analysis method provides a means for analyzing and extrapolating the resulting failures using the two-parameter Weibull distribution function. It is the object of this document to establish a common and reproducible test method for determining diode surge voltage tolerance consistent with an ESD event during the manufacturing, packaging, transportation or installation processes of PV modules.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Status |
IEC PUBLICATION |
| Situation |
Currently active
|
|
| Committee |
TC 82
SOLAR PHOTOVOLTAIC ENERGY SYSTEMS
|
| Responsible |
De heer VAN HECKE Luk
|
| BEC Approval |
2017-04-10 |
| ICS-Code (International Standards Classification) |
27.160
|
| NBN Status |
New |
|
| IEC publication date |
2017-04-10 |
| IEC stability date |
2026-12-31 |
| IEC file modification date |
2017-04-10 |
| IEC last modification date |
2019-12-11 |
|
