| Publication CODE |
Title |
| IEC 62979:2017 (2017-08) |
PHOTOVOLTAIC MODULES - BYPASS DIODE - THERMAL RUNAWAY TEST |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
85.00 €
|
13. |
Description
IEC 62979:2017 provides a method for evaluating whether a bypass diode as mounted in the module is susceptible to thermal runaway or if there is sufficient cooling for it to survive the transition from forward bias operation to reverse bias operation without overheating. This test methodology is particularly suited for testing of Schottky barrier diodes, which have the characteristic of increasing leakage current as a function of reverse bias voltage at high temperature, making them more susceptible to thermal runaway.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Status |
IEC PUBLICATION |
| Situation |
Currently active
|
|
| Committee |
TC 82
SOLAR PHOTOVOLTAIC ENERGY SYSTEMS
|
| Responsible |
De heer VAN HECKE Luk
|
| BEC Approval |
2017-08-10 |
| ICS-Code (International Standards Classification) |
27.160
|
| NBN Status |
New |
|
| IEC publication date |
2017-08-10 |
| IEC stability date |
2026-12-31 |
| IEC file modification date |
2017-08-10 |
| IEC last modification date |
2019-12-11 |
|
