| Publication CODE |
Title |
| IEC TS 62804-1-1:2020 (2020-01) |
PHOTOVOLTAIC (PV) MODULES - TEST METHODS FOR THE DETECTION OF POTENTIAL-INDUCED DEGRADATION - PART 1-1: CRYSTALLINE SILICON - DELAMINATION |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
85.00 €
|
16. |
Description
IEC 62804-1-1:2020 defines procedures to test and evaluate for potential-induced degradation-delamination (PID-d) mode in the laminate of crystalline silicon PV modules-principally those with one or two glass faces. This document evaluates delamination attributable to current transfer between ground and the module cell circuit. Elements driving the delamination that this test is designed to actuate include reduced adhesion associated with damp heat exposure, sodium accumulation at interfaces, and cathodic gas evolution in the cell circuit, metallization, and other components within the PV module activated by the voltage potential. The change in power of crystalline silicon PV modules associated with the stress factors applied (the purview of IEC TS 62804-1) is not considered in the scope.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Status |
IEC PUBLICATION |
| Situation |
Currently active
|
|
| Committee |
TC 82
SOLAR PHOTOVOLTAIC ENERGY SYSTEMS
|
| Responsible |
De heer VAN HECKE Luk
|
| BEC Approval |
2020-01-10 |
| ICS-Code (International Standards Classification) |
27.160
|
| NBN Status |
New |
|
| IEC publication date |
2020-01-10 |
| IEC stability date |
2023-12-31 |
| IEC file modification date |
2020-01-10 |
| IEC last modification date |
2020-02-05 |
|
