| Publication CODE |
Title |
| IEC TS 62804-2:2022 (2022-03) |
PHOTOVOLTAIC (PV) MODULES - TEST METHODS FOR THE DETECTION OF POTENTIAL-INDUCED DEGRADATION - PART 2: THIN-FILM |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
286.00 €
|
44. |
Description
IEC TS 62804-2:2022 defines apparatus and procedures to test and evaluate the durability of photovoltaic (PV) modules to power loss by the effects of high voltage stress in a damp heat environment, referred to as potential-induced degradation (PID). This document defines a test method that compares the coulomb transfer between the active cell circuit and ground through the module packaging under voltage stress during accelerated stress testing with the coulomb transfer during outdoor testing to determine an acceleration factor for the PID.
This document tests for the degradation mechanisms involving mobile ions influencing the electric field over the semiconductor absorber layer or electronically interacting with the films such that module power is affected.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Status |
IEC PUBLICATION |
| Situation |
Currently active
|
|
| Committee |
TC 82
SOLAR PHOTOVOLTAIC ENERGY SYSTEMS
|
| Responsible |
De heer VAN HECKE Luk
|
| BEC Approval |
2022-03-29 |
| ICS-Code (International Standards Classification) |
27.160
|
| NBN Status |
New |
|
| IEC publication date |
2022-03-29 |
| IEC stability date |
2025-12-31 |
| IEC file modification date |
2022-03-29 |
| IEC last modification date |
2022-03-29 |
|
