Publication details
| Publication CODE |
Title |
| IEC 61164:2004 (2004-03) |
RELIABILITY GROWTH - STATISTICAL TEST AND ESTIMATION METHODS |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
318.00 €
|
55. |
Description
IEC 61164:2004 gives models and numerical methods for reliability growth assessments based on failure data, which were generated in a reliability improvement programme. These procedures deal with growth, estimation, confidence intervals for product reliability and goodness-of-fit tests. The main changes with respect to the previous edition are:
- addition of two statistical models for reliability growth planning and tracking in the product design phase;
- statistical methods for the reliability growth programme in the design phase of IEC 61014;
- addition of the discrete reliability growth model for the test phase;
- addition of the fixed number of faults model for the test phase, clarification of the symbols used for various models;
- addition of real lif examples for most of the statistical models;
- numerical correction of tables in the reliability growth test example.
This publication is to be read in conjunction with IEC 61014:2003.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
Status
| Status |
IEC PUBLICATION |
| Situation |
Currently active
Replaces
IEC 61164:1995
|
|
Origin
| Committee |
TC 56
DEPENDABILITY
|
| Responsible |
Monsieur DE LEEUW Thierry, Technical Officer
Diamant Building
Bd Auguste Reyers, 80
1030
BRUXELLES
Phone: +32 2 706 85 72
E-mail: thierry.deleeuw@ceb-bec.be
|
Approval
| BEC Approval |
2004-03-24 |
| ICS-Code (International Standards Classification) |
03.120.30
, 03.120.01
|
|
| IEC publication date |
2004-03-24 |
| IEC stability date |
2021-12-31 |
| IEC last modification date |
2018-11-27 |
|
|
