| Publication CODE |
Title |
| IEC 61649:1997 (1997-05) |
GOODNESS-OF-FIT TESTS, CONFIDENCE INTERVALS AND LOWER CONFIDENCE LIMITS FOR WEIBULL DISTRIBUTED DATA |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
85.00 €
|
31. |
Description
Provides numerical methods to complement graphical techniques in performing a goodness-of-fit test for Weibull distributed times to failure and gives an approximate procedure to obtain confidence intervals for the parameters of the two-parameter Weibull distribution when these are estimated by maximum likelihood. Applicable whenever a random sample of items is subjected to a test of times to failure for the purpose of estimating measures of reliability performance of the population from which these items were drawn.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Committee |
TC 56
DEPENDABILITY
|
| Responsible |
Monsieur DE LEEUW Thierry, Technical Officer
Diamant Building
Bd Auguste Reyers, 80
1030
BRUXELLES
Phone: +32 2 706 85 72
E-mail: thierry.deleeuw@ceb-bec.be
|
| BEC Approval |
1997-05-16 |
| ICS-Code (International Standards Classification) |
35.040
|
| NBN Status |
New |
|
| IEC publication date |
1997-05-16 |
| IEC last modification date |
2008-08-13 |
|
