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Publication details

Publication CODE Title
NBN EN 62374-1:2010/AC:2011 (2011-04) SEMICONDUCTOR DEVICES PART 1: TIME-DEPENDENT DIELECTRIC BREAKDOWN (TDDB) TEST FOR INTER-METAL LAYERS
 
Price Excl. VAT Total number of pages, tables and drawings
0.00 € .
Description
Corrigendum (April 2011) to EN 62374-1:2010
Class  C86  (ELECTRONIC COMPONENTS MICRO ELECTRONICS - DISCRETE SEMICONDUCTORS)
Available files
ATTENTION: Belgian registered standards (NBN EN or NBN HD) are generally only available in English or French. Only the cover page is translated and the document itself is in English or in French.

EN version
 
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Status
Status Registered trilingual Belgian standard EN or FR or DE
Situation Currently active
Origin
Committee TC 47
SEMICONDUCTOR DEVICES
Responsible Ir DELENS Marc
Approval
BEC Approval 2011-04-01
Registration 115667
ICS-Code (International Standards Classification) 31.080
NBN Status New
Date of availability (d.a.v.) 2011-04-01
Correspondences with international standards
Relation International standard Date
is identical to EN 62374-1:2010/AC:2011 2011-04-01