| Publication CODE |
Title |
| NBN EN 62374-1:2010/AC:2011 (2011-04) |
SEMICONDUCTOR DEVICES
PART 1: TIME-DEPENDENT DIELECTRIC BREAKDOWN (TDDB) TEST FOR INTER-METAL LAYERS |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
0.00 €
|
. |
Description
Corrigendum (April 2011) to EN 62374-1:2010
|
| Class |
C86
(ELECTRONIC COMPONENTS MICRO ELECTRONICS - DISCRETE SEMICONDUCTORS)
|
Available files
ATTENTION: Belgian registered standards (NBN EN or NBN HD) are generally
only available in English or French. Only the cover page is translated
and the document itself is in English or in French.
|
|
|
ATTENTION: With some browsers, you may experience problems if you open the downloaded file directly. If you experience this problem, please first save the file locally and then open it |
| Status |
Registered trilingual Belgian standard EN or FR or DE |
| Situation |
Currently active
|
|
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2011-04-01 |
| Registration |
115667 |
| ICS-Code (International Standards Classification) |
31.080
|
| NBN Status |
New |
|
| Date of availability (d.a.v.) |
2011-04-01 |
|
