Publication CODE |
Title |
IEC PAS 62177:2000 (2000-08) |
HIGHLY-ACCELERATED TEMPERATURE AND HUMIDITY STRESS TEST (HAST) |
|
Price Excl. VAT |
Total number of pages, tables and drawings |
21.00 €
|
8. |
Description
The highly-accelerated temperature and humidity stress test is performed for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments. It employs severe conditions of temperature, humidity, and bias which accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors which pass through it.
|
Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
Status |
IEC PUBLICATION |
Situation |
Withdrawn
|
|
Committee |
TC 47
SEMICONDUCTOR DEVICES
|
Responsible |
Ir DELENS Marc
|
BEC Approval |
2000-08-24 |
ICS-Code (International Standards Classification) |
35.040
|
NBN Status |
New |
|
IEC publication date |
2000-08-24 |
IEC last modification date |
2009-08-18 |
|