Publication details
| Publication CODE |
Title |
| NBN EN IEC 60749-26:2018 (2018-03) |
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 26: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING - HUMAN BODY MODEL (HBM) |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
25.00 €
|
2. |
Description
IEC 60749-26:2018 establishes the procedure for testing, evaluating, and classifying components and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined human body model (HBM) electrostatic discharge (ESD).
The purpose of this document is to establish a test method that will replicate HBM failures and provide reliable, repeatable HBM ESD test results from tester to tester, regardless of component type. Repeatable data will allow accurate classifications and comparisons of HBM ESD sensitivity levels.
ESD testing of semiconductor devices is selected from this test method, the machine model (MM) test method (see IEC 60749-27) or other ESD test methods in the IEC 60749 series. Unless otherwise specified, this test method is the one selected.
This fourth edition cancels and replaces the third edition published in 2013. This edition constitutes a technical revision. This standard is based upon ANSI/ESDA/JEDEC JS-001-2014. It is used with permission of the copyright holders, ESD Association and JEDEC Solid state Technology Association.
This edition includes the following significant technical changes with respect to the previous edition:
a) a new subclause relating to HBM stressing with a low parasitic simulator is added, together with a test to determine if an HBM simulator is a low parasitic simulator;
b) a new subclause is added for cloned non-supply pins and a new annex is added for testing cloned non-supply pins.
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| Class |
C
|
Available files
ATTENTION: Belgian registered standards (NBN EN or NBN HD) are generally
only available in English or French. Only the cover page is translated
and the document itself is in English or in French.
Very important notice: 98% of the text of the NBN EN 55XXX,
NBN EN 6XXXX comes from the IEC text which is NOT included.
This text can be ordered here:
IEC 60749-26:2018.
For the series NBN EN 50XXX, the standards are however complete.
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DE version
|
EN version
|
FR version
|
|
Status
| Status |
Registered trilingual Belgian standard EN or FR or DE |
| Situation |
Currently active
Replaces
NBN EN 60749-26:2014
|
|
Origin
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
Approval
| BEC Approval |
2018-02-19 |
| NBN Approval |
2018-04-27 |
| Belgian Official Journal |
2018-06-11 |
| Registration |
185565 |
| ICS-Code (International Standards Classification) |
31.080.01
|
| NBN Status |
New |
|
| Date of ratification (d.o.r.) |
2018-02-19 |
| Date of availability (d.a.v.) |
2018-03-23 |
| Date of announcement (d.o.a.) |
2018-05-19 |
| Date of publication (d.o.p.) |
2018-11-19 |
| Date of withdrawal former edition (d.o.w.) |
2021-02-19 |
|
Correspondences with international standards
| Relation |
International standard |
Date |
| is identical to |
EN IEC 60749-26:2018
|
2018-03-23 |
| is identical to |
IEC 60749-26:2018
|
2018-01-15 |
|
