| Publication CODE |
Title |
| NBN EN IEC 60749-17:2019 (2019-05) |
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 17: NEUTRON IRRADIATION |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
25.00 €
|
4. |
Description
The neutron irradiation test is performed to determine the susceptibility of semiconductor devices to non-ionizing energy loss (NIEL) degradation. The test described herein is applicable to integrated circuits and discrete semiconductor devices and is intended for military- and aerospace-related applications. It is a destructive test.
The objectives of the test are as follows:
a) to detect and measure the degradation of critical semiconductor device parameters as a function of neutron fluence, and
b) to determine if specified semiconductor device parameters are within specified limits after exposure to a specified level of neutron fluence (see Clause 6).
|
| Class |
C
|
Available files
ATTENTION: Belgian registered standards (NBN EN or NBN HD) are generally
only available in English or French. Only the cover page is translated
and the document itself is in English or in French.
Very important notice: 98% of the text of the NBN EN 55XXX,
NBN EN 6XXXX comes from the IEC text which is NOT included.
This text can be ordered here:
IEC 60749-17:2019.
For the series NBN EN 50XXX, the standards are however complete.
|
FR version
|
DE version
|
EN version
|
|
| Status |
Registered trilingual Belgian standard EN or FR or DE |
| Situation |
Currently active
Replaces
NBN EN 60749-17:2004
|
|
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2019-05-02 |
| NBN Approval |
2019-06-26 |
| ICS-Code (International Standards Classification) |
31.080.01
|
| NBN Status |
New |
|
| Date of ratification (d.o.r.) |
2019-05-02 |
| Date of availability (d.a.v.) |
2019-05-10 |
| Date of announcement (d.o.a.) |
2019-08-02 |
| Date of publication (d.o.p.) |
2020-02-02 |
| Date of withdrawal former edition (d.o.w.) |
2022-05-02 |
|
