| Publication CODE |
Title |
| IEC 62951-8:2023 (2023-01) |
SEMICONDUCTOR DEVICES - FLEXIBLE AND STRETCHABLE SEMICONDUCTOR DEVICES - PART 8: TEST METHOD FOR STRETCHABILITY, FLEXIBILITY, AND STABILITY OF FLEXIBLE RESISTIVE MEMORY |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
85.00 €
|
14. |
Description
IEC 62951-8:2023 (E) defines terms and specifies the test method for evaluating the stretchability, flexibility, and stability of flexible resistive memory. The test method descriptions include experimental procedures and the equipment to be used. It also includes general requirements for test conditions such as the temperature and relative humidity of the testing environment. The test method described in this document focuses on stability evaluation rather than reliability.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Status |
IEC PUBLICATION |
| Situation |
Currently active
|
|
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2023-01-19 |
| ICS-Code (International Standards Classification) |
31.080.99
|
| NBN Status |
New |
|
| IEC publication date |
2023-01-19 |
| IEC stability date |
2026-12-31 |
| IEC file modification date |
2023-01-19 |
| IEC last modification date |
2023-01-19 |
|
