| Publication CODE |
Title |
| IEC 60749-32:2002 (2002-08) |
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 32: FLAMMABILITY OF PLASTIC-ENCAPSULATED DEVICES (EXTERNALLY INDUCED) |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
21.00 €
|
9. |
Description
Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to external heating. The test uses a needle flame, simulating the effect of small flames which may result from fault conditions within equipment containing the device.
The contents of the corrigendum of August 2003 have been included in this copy.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2002-08-30 |
| ICS-Code (International Standards Classification) |
31.080.01
|
|
| IEC publication date |
2002-08-30 |
| IEC stability date |
2025-12-31 |
| IEC last modification date |
2018-11-22 |
|
