Publication details
| Publication CODE |
Title |
| IEC 62373:2006 (2006-07) |
BIAS-TEMPERATURE STABILITY TEST FOR METAL-OXIDE, SEMICONDUCTOR, FIELD-EFFECT TRANSISTORS (MOSFET) |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
85.00 €
|
27. |
Description
Provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET)
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
Status
| Status |
IEC PUBLICATION |
| Situation |
Currently active
|
|
Origin
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
Approval
| BEC Approval |
2006-07-18 |
| ICS-Code (International Standards Classification) |
31.080.30
|
|
| IEC publication date |
2006-07-18 |
| IEC stability date |
2025-12-31 |
| IEC last modification date |
2018-11-22 |
|
|
