| Publication CODE |
Title |
| IEC PAS 62165:2000 (2000-08) |
GUIDELINES FOR THE MEASUREMENT OF THERMAL RESISTANCE OF GAAS FETS |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
42.00 €
|
10. |
Description
For power GaAs FET applications requiring high reliability an accurate measurement of thermal resistance is extremely important to provide the user with knowledge of the FET's operating temperature so that more accurate life estimates can be made. FET failure mechanism and failure rates have in general, an exponential dependence on temperature.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Status |
IEC PUBLICATION |
| Situation |
Withdrawn
|
|
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2000-08-22 |
| ICS-Code (International Standards Classification) |
35.040
|
| NBN Status |
New |
|
| IEC publication date |
2000-08-22 |
| IEC last modification date |
2004-05-17 |
|
