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Publication details

Publication CODE Title
NBN EN 62979:2017 (2017-10) PHOTOVOLTAIC MODULE - BYPASS DIODE - THERMAL RUNAWAY TEST
 
Price Excl. VAT Total number of pages, tables and drawings
25.00 € 3.
Description
IEC 62979:2017(E) provides a method for evaluating whether a bypass diode as mounted in the module is susceptible to thermal runaway or if there is sufficient cooling for it to survive the transition from forward bias operation to reverse bias operation without overheating. This test methodology is particularly suited for testing of Schottky barrier diodes, which have the characteristic of increasing leakage current as a function of reverse bias voltage at high temperature, making them more susceptible to thermal runaway.
Class  C
Available files
ATTENTION: Belgian registered standards (NBN EN or NBN HD) are generally only available in English or French. Only the cover page is translated and the document itself is in English or in French.

Very important notice: 98% of the text of the NBN EN 55XXX, NBN EN 6XXXX comes from the IEC text which is NOT included. This text can be ordered here: IEC 62979:2017. For the series NBN EN 50XXX, the standards are however complete.

DE version
EN version
FR version
Status
Status Registered trilingual Belgian standard EN or FR or DE
Situation Currently active
Origin
Committee TC 82
SOLAR PHOTOVOLTAIC ENERGY SYSTEMS
Responsible De heer VAN HECKE Luk
Approval
BEC Approval 2017-09-14
NBN Approval 2017-12-21
Registration 185060
ICS-Code (International Standards Classification) 27.160
NBN Status New
Date of ratification (d.o.r.) 2017-09-14
Date of availability (d.a.v.) 2017-10-27
Date of announcement (d.o.a.) 2017-12-14
Date of publication (d.o.p.) 2018-06-14
Date of withdrawal former edition (d.o.w.) 2020-09-14
Correspondences with international standards
Relation International standard Date
is identical to EN 62979:2017 2017-10-27
is identical to IEC 62979:2017 2017-08-10
Relations to belgian/foreign publications
Type Origin Code Date
Document Foreign IEC/TS 61836