| Publication CODE |
Title |
| IEC 63202-1:2019 (2019-06) |
PHOTOVOLTAIC CELLS - PART 1: MEASUREMENT OF LIGHT-INDUCED DEGRADATION OF CRYSTALLINE SILICON PHOTOVOLTAIC CELLS |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
42.00 €
|
17. |
Description
IEC 63202-1:2019 describes procedures for measuring the light-induced degradation (LID) of crystalline silicon photovoltaic (PV) cells in simulated sunlight. The magnitude of LID in a crystalline silicon PV cell is determined by comparing maximum output power at Standard Test Conditions (STC) before, and after, exposure to simulated sunlight at a specified temperature and irradiance.
The purpose of this document is to provide standardized PV cell LID information to help PV module manufacturers in minimizing the mismatch between cells within the same module, thereby maximizing power yield.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Status |
IEC PUBLICATION |
| Situation |
Currently active
|
|
| Committee |
TC 82
SOLAR PHOTOVOLTAIC ENERGY SYSTEMS
|
| Responsible |
De heer VAN HECKE Luk
|
| BEC Approval |
2019-06-20 |
| ICS-Code (International Standards Classification) |
27.160
|
| NBN Status |
New |
|
| IEC publication date |
2019-06-20 |
| IEC stability date |
2021-12-31 |
| IEC file modification date |
2019-06-20 |
| IEC last modification date |
2019-06-20 |
|
