| Publication CODE |
Title |
| IEC 60749-12:2002 (2002-04) |
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 12: VIBRATION, VARIABLE FREQUENCY |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
11.00 €
|
7. |
Description
Describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages. The contents of the corrigendum of August 2003 have been included in this copy.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2002-04-30 |
| ICS-Code (International Standards Classification) |
31.080.01
|
|
| IEC publication date |
2002-04-30 |
| IEC stability date |
2019-12-31 |
| IEC last modification date |
2018-06-05 |
|
