| Publication CODE |
Title |
| IEC 60749-32:2002+AMD1:2010 CSV (2010-11) |
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 32: FLAMMABILITY OF PLASTIC-ENCAPSULATED DEVICES (EXTERNALLY INDUCED) |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
42.00 €
|
9 P. |
Description
IEC 60749-32:2002+A1:2010 is applicable to semiconductor devices (discrete devices and integrated circuits). The object of this test is to determine whether the device ignites due to external heating. The test uses a needle flame, simulating the effect of small flames which may result from fault conditions within equipment containing the device.
This consolidated version consists of the first edition (2002)
and its amendment 1 (2010). Therefore, no need to order amendment in
addition to this publication.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Status |
IEC PUBLICATION |
| Situation |
Currently active
|
|
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2010-11-29 |
| Registration |
107922 |
| ICS-Code (International Standards Classification) |
31.080.01
|
| NBN Status |
New |
|
| IEC publication date |
2010-11-29 |
| IEC stability date |
2025-12-31 |
| IEC last modification date |
2018-11-22 |
|
