| Publication CODE |
Title |
| IEC TR 63133:2017 (2017-10) |
SEMICONDUCTOR DEVICES - SCAN BASED AGEING LEVEL ESTIMATION FOR SEMICONDUCTOR DEVICES |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
122.00 €
|
17. |
Description
IEC TR 63133:2017(E) specifies a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level. The estimated ageing level can be used to improve the reliability of system.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Status |
IEC PUBLICATION |
| Situation |
Currently active
|
|
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2017-10-11 |
| ICS-Code (International Standards Classification) |
31.080.01
|
| NBN Status |
New |
|
| IEC publication date |
2017-10-11 |
| IEC stability date |
2022-12-31 |
| IEC file modification date |
2017-10-11 |
| IEC last modification date |
2017-10-11 |
|
