| Publication CODE |
Title |
| IEC 62373-1:2020 (2020-07) |
SEMICONDUCTOR DEVICES - BIAS-TEMPERATURE STABILITY TEST FOR METAL-OXIDE, SEMICONDUCTOR, FIELD-EFFECT TRANSISTORS (MOSFET) - PART 1: FAST BTI TEST FOR MOSFET |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
159.00 €
|
44. |
Description
IEC 62373-1:2020 provides the measurement procedure for a fast BTI (bias temperature instability) test of silicon based metal-oxide semiconductor field-effect transistors (MOSFETs).
This document also defines the terms pertaining to the conventional BTI test method.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Status |
IEC PUBLICATION |
| Situation |
Currently active
|
|
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2020-07-15 |
| ICS-Code (International Standards Classification) |
31.080.30
|
| NBN Status |
New |
|
| IEC publication date |
2020-07-15 |
| IEC stability date |
2025-12-31 |
| IEC file modification date |
2020-07-15 |
| IEC last modification date |
2020-07-15 |
|
