| Publication CODE |
Title |
| IEC 60147-2C:1970 (1970-01) |
SUPPLEMENT C - ESSENTIAL RATINGS AND CHARACTERISTICS OF SEMICONDUCTOR DEVICES AND GENERAL PRINCIPLES OF MEASURING METHODS
PART 2: GENERAL PRINCIPLES OF MEASURING METHODS |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
249.00 €
|
73 P. |
Description
Deals with transistors and considers collector-base capacitance of transistors, gives voltage ratings and measurable characteristics limiting the working voltages, indicates methods of measuring thermal resistance and defines switching and high-frequency parameters.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Status |
IEC PUBLICATION |
| Situation |
Withdrawn
|
|
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
1970-01-01 |
| ICS-Code (International Standards Classification) |
35.040
|
| NBN Status |
New |
|
| IEC publication date |
1970-01-01 |
| IEC last modification date |
2013-07-03 |
|
