| Publication CODE |
Title |
| IEC 60749:1996+AMD1:2000+AMD2:2001 CSV (2002-04) |
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
731.00 €
|
151. |
Description
Lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made.
Establishes uniform preferred test methods with preferred values for stress levels for judging the environmental properties of semiconductor devices.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2002-04-10 |
| ICS-Code (International Standards Classification) |
31.080.01
|
| NBN Status |
New |
|
| IEC publication date |
2002-04-10 |
| IEC last modification date |
2017-08-23 |
|
