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Publication details

Publication CODE Title
IEC 60749-43:2017 (2017-06) SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 43: GUIDELINES FOR IC RELIABILITY QUALIFICATION PLANS
 
Price Excl. VAT Total number of pages, tables and drawings
249.00 € 74.
Description
IEC 60749-43:2017 gives guidelines for reliability qualification plans of semiconductor integrated circuit products (ICs). This document is not intended for military- and space-related applications.
Class  C990  (IEC PUBLICATIONS IEC PUBLICATIONS)
Available files
EN/FR version

Status
Status IEC PUBLICATION
Situation Withdrawn
Replaced by  IEC 63287-1:2021
Origin
Committee TC 47
SEMICONDUCTOR DEVICES
Responsible Ir DELENS Marc
Approval
BEC Approval 2017-06-15
ICS-Code (International Standards Classification) 31.080.01
NBN Status New
IEC publication date 2017-06-15
IEC stability date 2021-12-31
IEC file modification date 2017-06-15
IEC last modification date 2018-01-11