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Publication details

Publication CODE Title
IEC 60749-26:2006 (2006-07) SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 26: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING - HUMAN BODY MODEL (HBM)
 
Price Excl. VAT Total number of pages, tables and drawings
85.00 € 27.
Description
Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined human body model (HBM) electrostatic discharge (ESD). The objective is to provide reliable, repeatable HBM ESD test results so that accurate classifications can be performed. This test method is applicable to all semiconductor devices and is classified as destructive.
Class  C990  (IEC PUBLICATIONS IEC PUBLICATIONS)
Available files
EN/FR version

Status
Status IEC PUBLICATION
Situation Withdrawn
Replaced by  IEC 60749-26:2013
Replaces  IEC 60749-26:2003
Origin
Committee TC 47
SEMICONDUCTOR DEVICES
Responsible Ir DELENS Marc
Approval
BEC Approval 2006-07-18
ICS-Code (International Standards Classification) 35.040
IEC publication date 2006-07-18
IEC stability date 2014-12-31
IEC last modification date 2013-04-23