Publication CODE |
Title |
NBN EN 60749-6:2002 (2002-08) |
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS
PART 6: STORAGE AT HIGH TEMPERATURE |
|
Price Excl. VAT |
Total number of pages, tables and drawings |
25.00 €
|
3 P.. |
Description
[Text at this stage is not available in English]
|
Class |
C86
(ELECTRONIC COMPONENTS MICRO ELECTRONICS - DISCRETE SEMICONDUCTORS)
|
Available files
|
EN version
|
FR version
|
DE version
|
|
Committee |
TC 47
SEMICONDUCTOR DEVICES
|
Responsible |
Ir DELENS Marc
|
BEC Approval |
2002-07-02 |
NBN Approval |
2002-10-09 |
Registration |
25001 |
ICS-Code (International Standards Classification) |
31.080.01
|
NBN Status |
New |
|
Date of ratification (d.o.r.) |
2002-08-13 |
Date of availability (d.a.v.) |
2002-08-13 |
Date of announcement (d.o.a.) |
2002-10-01 |
Date of publication (d.o.p.) |
2003-04-01 |
Date of withdrawal former edition (d.o.w.) |
2005-07-01 |
|