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Publication details

Publication CODE Title
NBN EN 60749-6:2002 (2002-08) SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS PART 6: STORAGE AT HIGH TEMPERATURE
 
Price Excl. VAT Total number of pages, tables and drawings
25.00 € 3 P..
Description
[Text at this stage is not available in English]
Class  C86  (ELECTRONIC COMPONENTS MICRO ELECTRONICS - DISCRETE SEMICONDUCTORS)
Available files
EN version
FR version
DE version
Status
Status IEC PUBLICATION
Situation Currently active
Replaces  IEC 61034-1:1997
Origin
Committee TC 47
SEMICONDUCTOR DEVICES
Responsible Ir DELENS Marc
Approval
BEC Approval 2002-07-02
NBN Approval 2002-10-09
Registration 25001
ICS-Code (International Standards Classification) 31.080.01
NBN Status New
Date of ratification (d.o.r.) 2002-08-13
Date of availability (d.a.v.) 2002-08-13
Date of announcement (d.o.a.) 2002-10-01
Date of publication (d.o.p.) 2003-04-01
Date of withdrawal former edition (d.o.w.) 2005-07-01
Correspondences with international standards
Relation International standard Date
is identical to EN 60749-6:2002 2002-08-01
is identical to IEC 60749-6:2002/ed. 1.0 2002-04-01