Publication CODE |
Title |
NBN EN IEC 61189-2-805:2024 (2024-05) |
TEST METHODS FOR ELECTRICAL MATERIALS, PRINTED BOARDS AND OTHER INTERCONNECTION STRUCTURES AND ASSEMBLIES - PART 2-805: X/Y CTE TEST FOR THIN BASE MATERIALS BY TMA |
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Price Excl. VAT |
Total number of pages, tables and drawings |
12.00 €
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2. |
Description
This part of IEC 61189 defines the method to be followed for the determination of the X/Y coefficient of thermal expansion of thin electrical insulating materials via the use of a thermomechanical analyser (TMA). This method is applicable to materials that are solid for the entire range of temperature used, and that retain sufficient rigidity over the temperature range so that so that irreversible indentation of the specimen by the sensing probe does not occur.
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Class |
C
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Available files
ATTENTION: Belgian registered standards (NBN EN or NBN HD) are generally
only available in English or French. Only the cover page is translated
and the document itself is in English or in French.
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Status |
IEC PUBLICATION |
Situation |
Currently active
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Committee |
CLC/SR 91
Electronics assembly technology
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BEC Approval |
2024-05-23 |
NBN Approval |
2024-05-29 |
NBN Status |
New |
|
Date of ratification (d.o.r.) |
2024-05-23 |
Date of announcement (d.o.a.) |
2024-08-23 |
Date of publication (d.o.p.) |
2025-02-23 |
Date of withdrawal former edition (d.o.w.) |
2027-05-23 |
IEC file modification date |
2024-05-24 |
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