Publication details
| Publication CODE |
Title |
| NBN EN IEC 60749-41:2020 (2020-10) |
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 41: STANDARD RELIABILITY TESTING METHODS OF NON-VOLATILE MEMORY DEVICES |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
14.00 €
|
3. |
Description
IEC 60749-41:2020 specifies the procedural requirements for performing valid endurance, retention and cross-temperature tests based on a qualification specification. Endurance and retention qualification specifications (for cycle counts, durations, temperatures, and sample sizes) are specified in JESD47 or are developed using knowledge-based methods such as in JESD94.
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| Class |
C
|
Available files
ATTENTION: Belgian registered standards (NBN EN or NBN HD) are generally
only available in English or French. Only the cover page is translated
and the document itself is in English or in French.
|
DE version
|
EN version
|
FR version
|
|
Status
| Status |
IEC PUBLICATION |
| Situation |
Currently active
|
|
Origin
| Committee |
CLC/SR 47
Semiconductor devices
|
Approval
| BEC Approval |
2020-08-26 |
| NBN Approval |
2020-10-22 |
| NBN Status |
New |
|
| Date of ratification (d.o.r.) |
2020-08-26 |
| Date of announcement (d.o.a.) |
2020-11-26 |
| IEC file modification date |
2020-09-05 |
|
|
