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Publication details

Publication CODE Title
IEC 60749-12:2017 (2017-12) SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 12: VIBRATION, VARIABLE FREQUENCY
 
Price Excl. VAT Total number of pages, tables and drawings
21.00 € 14.
Description
IEC 60749-12:2017 describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages
This second edition cancels and replaces the first edition published in 2002. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition:
a) alignment with MIL-STD-883J Method 2007, Vibration, variable frequency.

Class  C990  (IEC PUBLICATIONS IEC PUBLICATIONS)
Available files
EN/FR version

Status
Status IEC PUBLICATION
Situation Currently active
Replaces  IEC 60749-12:2002
Replaces  IEC 60749-12:2002/COR1:2003
Origin
Committee TC 47
SEMICONDUCTOR DEVICES
Responsible Ir DELENS Marc
Approval
BEC Approval 2017-12-13
ICS-Code (International Standards Classification) 31.080.01
NBN Status New
IEC publication date 2017-12-13
IEC stability date 2024-12-31
IEC file modification date 2017-12-13
IEC last modification date 2017-12-13