| Publication CODE |
Title |
| IEC PAS 62162:2000 (2000-08) |
FIELD-INDUCED CHARGED-DEVICE MODEL TEST METHOD FOR ELECTROSTATIC DISCHARGE WITHSTAND THRESHOLDS OF MICROELECTRONIC COMPONENTS |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
21.00 €
|
7. |
Description
Describes a uniform method for establishing charged-device model (CDM) electrostatic discharge (ESD) withstand thresholds. All packages semiconductor components, thin film circuits, surface acoustic wave (SAW) components, opto-electronic components, hybrid integrated circuits (HICS), and multi-chip modules (MCMs) containing any of these components are to be evaluated according to this standard. IEC/PAS 62162 will be re-issued in the form of IEC international standard under reference IEC 60748-20.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2000-08-22 |
| ICS-Code (International Standards Classification) |
31.080.01
|
|
| IEC publication date |
2000-08-22 |
| IEC stability date |
2018-12-31 |
| IEC last modification date |
2018-07-10 |
|
