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Publication details

Publication CODE Title
NBN EN IEC 60749-17:2019 (2019-05) SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 17: NEUTRON IRRADIATION
 
Price Excl. VAT Total number of pages, tables and drawings
25.00 € 4.
Description
The neutron irradiation test is performed to determine the susceptibility of semiconductor devices to non-ionizing energy loss (NIEL) degradation. The test described herein is applicable to integrated circuits and discrete semiconductor devices and is intended for military- and aerospace-related applications. It is a destructive test. The objectives of the test are as follows: a) to detect and measure the degradation of critical semiconductor device parameters as a function of neutron fluence, and b) to determine if specified semiconductor device parameters are within specified limits after exposure to a specified level of neutron fluence (see Clause 6).
Class  C
Available files
ATTENTION: Belgian registered standards (NBN EN or NBN HD) are generally only available in English or French. Only the cover page is translated and the document itself is in English or in French.

Very important notice: 98% of the text of the NBN EN 55XXX, NBN EN 6XXXX comes from the IEC text which is NOT included. This text can be ordered here: IEC 60749-17:2019. For the series NBN EN 50XXX, the standards are however complete.

FR version
DE version
EN version
Status
Status Registered trilingual Belgian standard EN or FR or DE
Situation Currently active
Replaces  NBN EN 60749-17:2004
Origin
Committee TC 47
SEMICONDUCTOR DEVICES
Responsible Ir DELENS Marc
Approval
BEC Approval 2019-05-02
NBN Approval 2019-06-26
ICS-Code (International Standards Classification) 31.080.01
NBN Status New
Date of ratification (d.o.r.) 2019-05-02
Date of availability (d.a.v.) 2019-05-10
Date of announcement (d.o.a.) 2019-08-02
Date of publication (d.o.p.) 2020-02-02
Date of withdrawal former edition (d.o.w.) 2022-05-02
Correspondences with international standards
Relation International standard Date
is identical to EN IEC 60749-17:2019 2019-05-10
is identical to IEC 60749-17:2019 2019-03-28