| Publication CODE |
Title |
| IEC 62951-3:2018 (2018-11) |
SEMICONDUCTOR DEVICES - FLEXIBLE AND STRETCHABLE SEMICONDUCTOR DEVICES - PART 3: EVALUATION OF THIN FILM TRANSISTOR CHARACTERISTICS ON FLEXIBLE SUBSTRATES UNDER BULGING |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
159.00 €
|
22. |
Description
IEC 62951-3:2018(E) specifies the method for evaluating thin film transistor characteristics on flexible substrates under bulging. The thin film transistor is fabricated on flexible substrates, including polyethylene terephthalate (PET), polyimide (PI), elastomer and others. The stress is applied by applying a uniformly-distributed pressure to the flexible substrate using the equipment.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Status |
IEC PUBLICATION |
| Situation |
Currently active
|
|
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2018-11-07 |
| ICS-Code (International Standards Classification) |
31.080.99
|
| NBN Status |
New |
|
| IEC publication date |
2018-11-07 |
| IEC stability date |
2023-12-31 |
| IEC file modification date |
2018-11-07 |
| IEC last modification date |
2018-11-07 |
|
